Browsing Electronic Systems Engineering (ESE) by Subject "LDMOS"
Now showing items 1-2 of 2
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Device-Circuit Reliability Co-Design in High voltage and Power devices
For the last four decades, silicon CMOS technology has captured a significant share in IC, smart power IC, SoC, and the power device market. But there is aggressive research on other materials such as graphene & similar ... -
ESD Design for Advanced CMOS and Analog nodes
The study of Electrostatic Discharge (ESD) reliability within Integrated Circuits (IC) is crucial due to its direct influence on electronic device performance, longevity, and functionality. As semiconductor technology ...