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dc.contributor.advisorGanapathy, Vinod
dc.contributor.authorKanmani, A
dc.date.accessioned2025-05-19T09:21:48Z
dc.date.available2025-05-19T09:21:48Z
dc.date.submitted2025
dc.identifier.urihttps://etd.iisc.ac.in/handle/2005/6940
dc.description.abstractIntelligent Electronic Devices (IEDs) are essential components of modern power grids, functioning as microprocessor-based controllers that facilitate communication, monitoring, protection, and control within Supervisory Control and Data Acquisition (SCADA) systems. As these devices operate across power generation, transmission, and distribution, they have become prime targets for cyberattacks, leading to risks such as large-scale power disruptions, unauthorized data access, and critical equipment failures. Communication between these devices is governed by the IEC 61850 standard, which defines the Manufacturing Message Specification (MMS) protocol over TCP/IP network stack. In this thesis, we propose IEDFuRL, a black-box fuzz testing tool for IEC 61850-based IEDs. IEDFuRL aims to identify vulnerabilities in the communication module of the IEDs. Our approach begins by crafting valid MMS requests targeting various data points within the IEDs and using response packets as feedback for categorization. We develop a reinforcement learning (RL) agent that is rewarded for discovering new category of responses and crashes. The agent learns the optimal sequence of mutations from any specific request packet to generate new category of responses and crashes thereby increasing the fuzz testing coverage.en_US
dc.description.sponsorshipPOWERGRID Center of Excellence in Cybersecurity(PGCoE)en_US
dc.language.isoen_USen_US
dc.relation.ispartofseries;ET00950
dc.rightsI grant Indian Institute of Science the right to archive and to make available my thesis or dissertation in whole or in part in all forms of media, now hereafter known. I retain all proprietary rights, such as patent rights. I also retain the right to use in future works (such as articles or books) all or part of this thesis or dissertationen_US
dc.subjectBlack-box Fuzzing, Reinforcement Learning, Intelligent Electronic Devicesen_US
dc.subjectIntelligent Electronic Devicesen_US
dc.subjectSCADAen_US
dc.subjectSupervisory Control and Data Acquisitionen_US
dc.subjectblack-box fuzz testing toolen_US
dc.subjectIEC 61850 standarden_US
dc.subjectReinforcement Learningen_US
dc.subjectManufacturing Message Specificationen_US
dc.subjectIEDFuRLen_US
dc.subjectFuzzeren_US
dc.subjectPyshark Libraryen_US
dc.subjectFuzz testingen_US
dc.subject.classificationResearch Subject Categories::TECHNOLOGY::Information technology::Computer scienceen_US
dc.titleIEDFuRL: A Black-box Fuzz Tester for IEC61850-based Intelligent Electronic Devices using Reinforcement Learningen_US
dc.typeThesisen_US
dc.degree.nameMTech (Res)en_US
dc.degree.levelMastersen_US
dc.degree.grantorIndian Institute of Scienceen_US
dc.degree.disciplineEngineeringen_US


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