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    Diffusion-Controlled Growth of Phases in Metal-Tin Systems Related to Microelectronics Packaging 

    Baheti, Varun A (2018-08-28)
    The electro–mechanical connection between under bump metallization (UBM) and solder in flip–chip bonding is achieved by the formation of brittle intermetallic compounds (IMCs) during the soldering process. These IMCs ...

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    Author
    Baheti, Varun A (1)
    SubjectAu–Sn Systems (1)Co–Ni–Ta System (1)
    Co–Ta System (1)
    Cu(Ni)–Sn System (1)Cu–Sn System (1)Cu–Sn Systems (1)Electroplating - Copper Deposition (1)Electroplating - Tin Deposition (1)Kirkendall Voids (1)
    Materials Engineering (1)
    ... View MoreDate Issued2018 (1)Has File(s)Yes (1)

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