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    ESD Reliability Physics and Reliability Aware Design of Advanced High Voltage CMOS & Beyond CMOS Devices 

    Kranthi, Nagothu Karmel
    Electrostatic Discharge (ESD) reliability is one of the major reliability concerns in integrated circuits (IC), which if not addressed while designing devices and circuits, can lead to a permanent damage to the Integrated ...

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    Author
    Kranthi, Nagothu Karmel (1)
    SubjectCMOS device (1)Electrostatic Discharge Realiability of Electron Devices (1)FET (1)
    graphene (1)
    TECHNOLOGY (1)
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