Browsing Electronic Systems Engineering (ESE) by Subject "Electrostatic Discharge Realiability of Electron Devices"
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ESD Reliability Physics and Reliability Aware Design of Advanced High Voltage CMOS & Beyond CMOS Devices
Electrostatic Discharge (ESD) reliability is one of the major reliability concerns in integrated circuits (IC), which if not addressed while designing devices and circuits, can lead to a permanent damage to the Integrated ...