Browsing Division of Electrical, Electronics, and Computer Science (EECS) by Subject "Gate Delay Models"

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    • Process Variability-Aware Performance Modeling In 65 nm CMOS 

      Harish, B P (2011-02-25)
      With the continued and successful scaling of CMOS, process, voltage, and temperature (PVT), variations are increasing with each technology generation. The process variability impacts all design goals like performance, ...

    • Random Local Delay Variability : On-chip Measurement And Modeling 

      Das, Bishnu Prasad (2011-01-18)
      This thesis focuses on random local delay variability measurement and its modeling. It explains a circuit technique to measure the individual logic gate delay in silicon to study within-die variation. It also suggests a ...