dc.contributor.advisor | Ramu, T S | |
dc.contributor.author | Rai, Sudhanshu | |
dc.date.accessioned | 2011-05-09T07:32:28Z | |
dc.date.accessioned | 2018-07-31T05:02:38Z | |
dc.date.available | 2011-05-09T07:32:28Z | |
dc.date.available | 2018-07-31T05:02:38Z | |
dc.date.issued | 2011-05-09 | |
dc.date.submitted | 2004 | |
dc.identifier.uri | https://etd.iisc.ac.in/handle/2005/1177 | |
dc.identifier.abstract | http://etd.iisc.ac.in/static/etd/abstracts/1536/G17952-Abs.pdf | en_US |
dc.language.iso | en_US | en_US |
dc.relation.ispartofseries | G17952 | en_US |
dc.subject | Electrical Insulators And Insulation | en_US |
dc.subject | Electrical Stress Testing | en_US |
dc.subject | Electrical Insulation | en_US |
dc.subject.classification | Electrical Engineering | en_US |
dc.title | Design Of An Optimum Test Plan For Accelerated Life Testing Of Electrical Insulation Under Progressive Stress | en_US |
dc.type | Thesis | en_US |
dc.degree.name | MSc Engg | en_US |
dc.degree.level | Masters | en_US |
dc.degree.discipline | Faculty of Engineering | en_US |