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dc.contributor.advisorRamakrishna Rao, M; Mohan, S
dc.contributor.authorRao, Narasimha, K
dc.date.accessioned2025-12-04T05:12:19Z
dc.date.available2025-12-04T05:12:19Z
dc.date.submitted1988
dc.identifier.urihttps://etd.iisc.ac.in/handle/2005/7574
dc.description.abstractNo Abstract
dc.language.isoen_US
dc.relation.ispartofseriesT02623
dc.rightsI grant Indian Institute of Science the right to archive and to make available my thesis or dissertation in whole or in part in all forms of media, now hereafter known. I retain all proprietary rights, such as patent rights. I also retain the right to use in future works (such as articles or books) all or part of this thesis or dissertation
dc.subjectCharacterization Methods
dc.subjectLaser Damage Threshold
dc.subjectOptical Thin Films
dc.titleInfluence of deposition parameters on the optical properties of t1,o2 and s1 o2 films
dc.typeThesis
dc.degree.namePhD
dc.degree.levelDoctoral
dc.degree.grantorIndian Institute of Science
dc.degree.disciplineScience


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