In-Line Diagnostics for Inkjet Printed Electronics

Abstract

The development of solution processed thin film circuits involves various process stages. One of the key parameters that decides the performance of the circuit is the semiconductor-insulator interface and the quality of the insulator. Usually, the performance of the transistor is ascertained only after all layers are deposited and the transistor is characterized. This work is an attempt to guess the performance of the transistor after the dielectric deposition by using optical methods to extract dielectric quality. The technique can become a part of the manufacturing process to provide feedback and warnings at an early stage of the process flow thereby improving reliability and reducing costs.