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    • Instrumentation and Applied Physics (IAP)
    • Browsing Instrumentation and Applied Physics (IAP) by Subject
    •   etd@IISc
    • Division of Physical and Mathematical Sciences
    • Instrumentation and Applied Physics (IAP)
    • Browsing Instrumentation and Applied Physics (IAP) by Subject
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    Browsing Instrumentation and Applied Physics (IAP) by Subject "back plane testing"

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      • Development of an Automated Test & Parameter Extraction Tool for Active Matrix Displays 

        Daniel, Sanil K
        Active matrix backplanes used in at panel displays are prone to line faults (opens and shorts) and pixel faults (poor transistor performance and parameter variations). These faults could occur during fabrication or ...

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