Browsing Instrumentation and Applied Physics (IAP) by Subject "HfO2 Back Gated Graphene Transistors"
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Optimization of HfO2 Thin Films for Gate Dielectric Applications in 2-D Layered Materials
(2018-03-02)Recently, high-κ materials have become the focus of research and been extensively utilized as the gate dielectric layer in aggressive scaled complementary metal-oxide-semiconductor (CMOS) technology. Hafnium dioxide (HfO2) ...