Browsing Instrumentation and Applied Physics (IAP) by Author "Sri Ram Shankar, R"
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A Probing System for Dynamic Mode Atomic Force Microscopy Based on Specialized Probes
Sri Ram Shankar, RThe dynamic mode atomic force microscope (AFM) is a versatile tool that uses a resonantly excited micro-cantilever probe to obtain a sample’s topography and to characterize its material properties. While a number of useful ...