Browsing Division of Physical and Mathematical Sciences by Subject "Thin Films (Damage)"
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Investigation Of Damage Process In Current Stressed Metal Film Using Noise Spectroscopy, Scanning Thermal Microscopy And Simulation Studies
(2010-09-27)Reliability, besides the performance, is one of the important key factors of success of any technology. While a product should perform at best as desired, it must also be capable of working for intended period of life ...