Browsing Division of Physical and Mathematical Sciences by Advisor "Jayanth, G R"
Now showing items 1-9 of 9
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Design and analysis of a miniaturized Atomic Force Microscope scan head
An Atomic Force Microscope (AFM) is a type of scanning probe microscope used for nano-scale characterization, topography imaging and manipulation of conducting and insulating samples, at sub-nanometer resolution. Its ... -
Design, Fabrication and Development of Polymer Microcantilever for Flow Rate Measurement and Thermal Actuation
Design, fabrication and development of polymer microcantilever for flow rate measurement and thermal actuation Research Supervisors: Prof. K. Rajanna and Dr. G. R. Jayanth Microcantilevers are sensitive micromechanical ... -
Diamagnetically levitated nano positioners with large-range and multiple degrees of freedom
Precision positioning stages are indispensable in many branches of science and engineering, where they are employed for imaging, manipulation, fabrication, and material characterization. Compact, multi-degree-of-freedom ... -
An electromagnetically actuated mesoscale ball and socket joint for applications in 3-D metrology and electrical characterization
Micro-robotics is concerned with development of robotic systems to manipulate micro-meter sized objects. To develop functional micro-robotic manipulators, it is necessary to develop joints that possess large motion range ... -
Linear Nanopositioning Systems for Scanning Probe Microscopy
Scanning probe microscopes (SPM) are vital for visualizing and characterizing samples of interest to various fields with nanometer resolution, such as semiconductor fabrication, microbiology, and material engineering. The ... -
A micro-robotic system with integrated force sensing capability for manipulation of magentic particles in three dimensions
Micro-robotic systems are used in various fields of science and technology for the manipulation of objects of size less than a millimeter. Magnetic tweezers can be considered as micro-robotic systems due to their ability ... -
A Microrobotic System with Integrated Force Sensing Capability for Manipulation of Magnetic Particles in Three Dimensions
Micro-robotic systems are used in various fields of science and technology for the manipulation of objects of size less than a millimeter. Magnetic tweezers can be considered as micro-robotic systems due to their ability ... -
A Probing System for Dynamic Mode Atomic Force Microscopy Based on Specialized Probes
The dynamic mode atomic force microscope (AFM) is a versatile tool that uses a resonantly excited micro-cantilever probe to obtain a sample’s topography and to characterize its material properties. While a number of useful ... -
A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology
(2018-06-14)With increase in the number of three dimensional (3-D) nanometer-scale objects that are being either fabricated or studied, there is a need to accurately characterize their geometry. While the Atomic force microscope (AFM) ...