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Atomic-level Investigation and Proposals to Address Technological Roadblocks and Reliability Challenges in 2D Material Based Nanoelectronic Devices

Kumar, Jeevesh

The transistor scaling is witness to many extraordinary inventions during its consecutive miniaturization. The journey began from Dennard’s classical constant field scaling, crossing through the milestones like strain ...

First-principles based study of graphene inserted tellurene-metal interface

Kesharwani, Om

Atomically thin two-dimensional (2D) materials have attracted extensive research interest since the journey started with the successful isolation of graphene in 2004. 2D materials have shown remarkable advancement in the ...