Browsing Electrical Communication Engineering (ECE) by Subject "Circuit Design"
Now showing items 1-2 of 2
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Process Variability-Aware Performance Modeling In 65 nm CMOS
(2011-02-25)With the continued and successful scaling of CMOS, process, voltage, and temperature (PVT), variations are increasing with each technology generation. The process variability impacts all design goals like performance, ... -
Variability Aware Device Modeling and Circuit Design in 45nm Analog CMOS Technology
(2018-05-10)Process variability is a major challenge for the design of nano scale MOSFETs due to fundamental physical limits as well as process control limitations. As the size of the devices is scales down to improve performance, the ...