Browsing Electrical Communication Engineering (ECE) by Subject "65nm CMOS"

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    • Process Variability-Aware Performance Modeling In 65 nm CMOS 

      Harish, B P (2011-02-25)
      With the continued and successful scaling of CMOS, process, voltage, and temperature (PVT), variations are increasing with each technology generation. The process variability impacts all design goals like performance, ...