Browsing Division of Electrical, Electronics, and Computer Science (EECS) by Advisor "Bhat, Navakanta"
Now showing items 1-10 of 10
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Design, Analysis And Characterization Of Torsional MEMS Varactor
(2010-10-11)Varactors form an important part of many communication circuits. They are utilized in oscillators, tunable matching networks, tunable filters and phase-shifters. This thesis deals with the design, analysis, characterization ... -
Device Structure And Material Exploration For Nanoscale Transistor
(2013-07-03)There is a compelling need to explore different material options as well as device structures to facilitate smooth transistor scaling for higher speed, higher density and lower power. The enormous potential of nanoelectronics, ... -
Exploration of Displacement Detection Mechanisms in MEMS Sensors
(2017-11-14)MEMS Sensors are widely used for sensing inertial displacements. The displacements arising out of acceleration /Coriolis effect are typically in the range of 1 nm-1 m. This work investigates the realization of high resolution ... -
High-k Dielectrics For Metal-Insulator-Metal Capacitors
(2016-11-23)Metal-insulator-metal (MIM) capacitors are used for analog, RF, and DRAM applications in ICs. The International Technology Roadmap for Semiconductors (ITRS) specifies continuing increase in capacitance density (> 7 fF/ ... -
Low Power Receiver Architecture And Algorithms For Low Data Rate Wireless Personal Area Networks
(2013-09-03)Sensor nodes in a sensor network is power constrained. Transceiver electronics of a node in sensor network consume a good share of total power consumed in the node. The thesis proposes receiver architecture and algorithms ... -
Modular Design Of Microheaters, Signal Conditioning ASIC And ZnO Transducer For Gas Sensor System Platform
(2013-07-16)With the proliferation of industries world-wide, there is a growing need and interest in sensing and monitoring environmental pollutants and monitoring the concentration of chemicals/gases in industrial process control. ... -
Process Variability-Aware Performance Modeling In 65 nm CMOS
(2011-02-25)With the continued and successful scaling of CMOS, process, voltage, and temperature (PVT), variations are increasing with each technology generation. The process variability impacts all design goals like performance, ... -
Towards a Unified Framework for Design of MEMS based VLSI Systems
(2018-02-12)Current day VLSI systems have started seeing increasing percentages of multiple energy domain components being integrated into the mainstream. Energy domains such as mechanical, optical, fluidic etc. have become all pervasive ... -
Variability Aware Device Modeling and Circuit Design in 45nm Analog CMOS Technology
(2018-05-10)Process variability is a major challenge for the design of nano scale MOSFETs due to fundamental physical limits as well as process control limitations. As the size of the devices is scales down to improve performance, the ...