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"Phase-Correlation Based Displacemnt-Metrology" - Few Investigations

dc.contributor.advisorRao, L Kameswara
dc.contributor.authorDiwan, C Yogesh
dc.date.accessioned2011-10-04T10:48:04Z
dc.date.accessioned2018-07-31T06:04:15Z
dc.date.available2011-10-04T10:48:04Z
dc.date.available2018-07-31T06:04:15Z
dc.date.issued2011-10-04
dc.date.submitted2005
dc.identifier.urihttps://etd.iisc.ac.in/handle/2005/1464
dc.identifier.abstracthttp://etd.iisc.ac.in/static/etd/abstracts/1883/G19148-Abs.pdfen_US
dc.language.isoen_USen_US
dc.relation.ispartofseriesG19148en_US
dc.subjectPhase Correlation - Metrologyen_US
dc.subjectPhase Measuring Instrumentsen_US
dc.subjectMicro-object Dimensions - Measurementen_US
dc.subjectOptical Metrologyen_US
dc.subjectTransparent Plates - Refractive Index - Measurementen_US
dc.subjectDiffraction Fringes - Measurementen_US
dc.subjectGaussian Laser Beamsen_US
dc.subjectFourier Phase Shift Method (FPS)en_US
dc.subjectRefractive Indexen_US
dc.subject.classificationInstrumentationen_US
dc.title"Phase-Correlation Based Displacemnt-Metrology" - Few Investigationsen_US
dc.typeThesisen_US
dc.degree.nameMSc Enggen_US
dc.degree.levelMastersen_US
dc.degree.disciplineFaculty of Engineeringen_US


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