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    Investigation Of Damage Process In Current Stressed Metal Film Using Noise Spectroscopy, Scanning Thermal Microscopy And Simulation Studies 

    Bora, Achyut (2010-09-27)
    Reliability, besides the performance, is one of the important key factors of success of any technology. While a product should perform at best as desired, it must also be capable of working for intended period of life ...

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    Author
    Bora, Achyut (1)
    SubjectMetal Film (1)Metal Nanowires (1)Metal Thin Film (1)Noise - Measurement (1)Noise - Spectroscopy (1)
    Solid State Physics (1)
    Thermal Microscopy (1)
    Thin Films (Damage) (1)... View MoreDate Issued
    2010 (1)
    Has File(s)
    Yes (1)

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