Show simple item record

dc.contributor.advisorPratap, Rudra
dc.contributor.advisorVarma, Manoj
dc.contributor.authorSingh, Prem Prakash
dc.date.accessioned2020-11-25T05:46:04Z
dc.date.available2020-11-25T05:46:04Z
dc.date.submitted2019
dc.identifier.urihttps://etd.iisc.ac.in/handle/2005/4695
dc.description.abstractSilicon photonics is a promising platform for photonic devices and circuits, largely driven by advanced complementary metal-oxide-semiconductor (CMOS) processing technology. An extremely crucial component for a photonic device is the optical waveguide, which guides optical signals. A key development in this research area was the availability of high-quality silicon-on-insulator (SOI) wafers. SOI offers the possibility of highly integrated and scaled photonic devices, due to strong optical confinement as a result of high-index contrast between silicon and silicon-oxide layer. SOI waveguides have wide applications ranging from telecommunication, optical interconnection, to chemical and biosensing. In this work, we have presented a conceptual design for sensing applications. A 220 nm thin silicon microcantilever acts as an optical waveguide, end-coupled to another microcantilever waveguide. The sensitivity of this device is dependent on vertical misalignment and the transversal gap between the coupled microcantilever waveguides. We have fabricated SOI-based end-coupled waveguides with 50 nm vertical misalignment and varying transversal gap. The insertion loss is measured across the end-coupled microcantilever waveguides having gaps ranging from 200 nm to 600 nm. The gaps were created by milling SOI microbeams using focused ion beam (FIB). The effect of ion beam milling on these structures has also been investigated. This device is designed to operate as a single sensor for two different parameters, namely, refractive index change arising from molecular binding and strain induced by temperature changes, which usually requires individual sensor elements dedicated to each parameter. Our design overcomes this multiplexing challenge by utilizing a suspended Bragg grating with a single defect which respond differently to refractive index changes and geometric changes due to strain. Hence, the signal from this device effectively contains two channels each carrying unique information about the molecular binding event. We have fabricated such suspended Bragg grated waveguide devices with defect mode and characterized their performance.en_US
dc.description.sponsorshipCSIRen_US
dc.language.isoen_USen_US
dc.rightsI grant Indian Institute of Science the right to archive and to make available my thesis or dissertation in whole or in part in all forms of media, now hereafter known. I retain all proprietary rights, such as patent rights. I also retain the right to use in future works (such as articles or books) all or part of this thesis or dissertationen_US
dc.subjectMEMSen_US
dc.subjectSilicon Photonicsen_US
dc.subjectOptomechanical Devicesen_US
dc.subjectFIB Millingen_US
dc.subjectBragg Gratingen_US
dc.subjectOptical Waveguideen_US
dc.subjectMicrocantilever Waveguidesen_US
dc.subject.classificationMechanical Engineeringen_US
dc.titleFabrication and Characterization of Optomechanical Devicesen_US
dc.typeThesisen_US
dc.degree.namePhDen_US
dc.degree.levelDoctoralen_US
dc.degree.grantorIndian Institute of Scienceen_US
dc.degree.disciplineEngineeringen_US


Files in this item

This item appears in the following Collection(s)

Show simple item record