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A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology
(2018-06-14)
With increase in the number of three dimensional (3-D) nanometer-scale objects that are being either fabricated or studied, there is a need to accurately characterize their geometry. While the Atomic force microscope (AFM) ...
A Probing System for Dynamic Mode Atomic Force Microscopy Based on Specialized Probes
The dynamic mode atomic force microscope (AFM) is a versatile tool that uses a resonantly excited micro-cantilever probe to obtain a sample’s topography and to characterize its material properties. While a number of useful ...