Browsing Division of Interdisciplinary Research by Advisor "Shrivastava, Mayank"
Now showing items 1-2 of 2
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Electro-thermal Transport through Graphene & CNT at Nano-second Time Scales and its Implications on Device Reliability
The prospects of using Graphene and MWCNT as a channel material for RF transistors and interconnects, respectively, have recently garnered much attention. E orts are being made for improvements at the material and device ... -
Reliability Physics of Thin-Film Transistors
Thin-film transistor technology based on non-crystalline materials forms the workhorse of large area electronics applications including display systems, sensor systems and novel technologies including flexible electronics. ...