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Random Local Delay Variability : On-chip Measurement And Modeling
(2011-01-18)
This thesis focuses on random local delay variability measurement and its modeling. It explains a circuit technique to measure the individual logic gate delay in silicon to study within-die variation. It also suggests a ...
Process Variability-Aware Performance Modeling In 65 nm CMOS
(2011-02-25)
With the continued and successful scaling of CMOS, process, voltage, and temperature (PVT), variations are increasing with each technology generation. The process variability impacts all design goals like performance, ...