Browsing Division of Electrical, Electronics, and Computer Science (EECS) by Advisor "Jacob, T Matthew"

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    • Low Power Test Methodology For SoCs : Solutions For Peak Power Minimization 

      Tudu, Jaynarayan Thakurdas (2013-09-13)
      Power dissipated during scan testing is becoming increasingly important for today’s very complex sequential circuits. It is shown that the power dissipated during test mode operation is in general higher than the power ...

    • Superscalar Processor Models Using Statistical Learning 

      Joseph, P J (2009-06-24)
      Processor architectures are becoming increasingly complex and hence architects have to evaluate a large design space consisting of several parameters, each with a number of potential settings. In order to assist in guiding ...